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Starrett L3 systems represent a new and easier solution for creating a test; performing a test; analyzing your test results; and managing test data.
L3 systems meet the requirements of today’s research scientist, design engineer, quality manager or technician responsible for material characterization, verification and validation.
Unlike traditional material testing systems that involve programming and having to know exactly what measurements are required before the test, L3 systems employ a simple methodology. You create your test method. Your test method creates your graph. And then you measure on the graph using a set of analysis tools.
You can measure any point and any segment anywhere along the graph. Analyze using stress, strain, load, distance, and time. Your measurements are displayed on your graph and shown in data tables with statistics and tolerances.
Measure Results using Graph
Graphical Test Methods
Coefficient of Friction Testing
Measure Stress, Strain, Elongation and Strength
Measure Offset Yield
Measure Energy, Work and Resilience
Measure Load, Distance and Time
Measure minimums, maximums and averages
Measure Slopes and Intersections
Measure Peaks, Valleys, Counts and averages
Measure Break Rupture
Measure Delta between results within a test
Measure results from multiple test runs simultaneously
Measure Spring rate, Constant and free length
Create Mathematical Expressions
Create basic Expressions using add, subtract, multiply and divide
Full Export and Data Reporting
User Interface through All-in-one Computer Workstation, Windows OS
Compatible with the New Starrett Spring Rotary Tale
Digital I/O (with Automation Builder)
Analogue I/O (with Automation Builder
Use Command and Conditional Logic (with Automation builder)